تاثیر انبارمانی بر ثابت دی‌الکتریک دانه، خصوصیات کیفی آرد و رئولوژیکی خمیر دو رقم گندم (تجن و مرودشت)

نویسنده
حسین احمدی چناربن
استادیار، گروه زراعت و اصلاح نباتات، واحد ورامین - پیشوا، دانشگاه آزاد اسلامی، ورامین، ایران.
10.29252/fsct.16.96.161
چکیده
استفاده از گندم تازه برداشت شده در برخی از فصول، یکی از مهم‌ترین عوامل بروز ضایعات در بخش تولید و مصرف نان است. اما به واسطه نگهداری مناسب، کیفیت گندم در اثر انجام اکسیداسیون طبیعی و تشکیل پیوندهای بین مولکولی در شبکه پروتئینی بهبود می‌یابد. در این راستا در پژوهش حاضر تاثیر زمان نگهداری در سه سطح (صفر، سی و شصت روز) بر مقدار ثابت دی‌الکتریک دانه‌های گندم، ویژگی‌های فیزیکو شیمیایی آرد و خواص رئولوژیکی خمیر حاصل از دو رقم گندم، تجن و مرودشت بررسی گردید. طبق نتایج، با گذشت زمان، مقدار pH در هر دو رقم کاهش اما مقدار پروتئین، گلوتن مرطوب، رسوب زلنی، ثابت دی‌الکتریک و رطوبت افزایش یافت اما تغییر معنی‌داری در مقدار خاکستر دو رقم مشاهده نشد. در همین راستا کلیه صفات اندازه‌گیری شده غیر از pH و پروتئین در رقم تجن بیشتر و معنی‌دارتر از رقم مرودشت بود. همچنین با گذشت زمان، مقدار جذب آب، زمان گسترش خمیر و زمان پایداری خمیر در هر دو رقم افزایش یافت اما مقدار این شاخص‌ها و مقدار افزایش آن‌ها در رقم تجن بیشتر از مرودشت بود در حالی‌که درجه نرم شدن خمیر پس از ده و دوازده دقیقه در هر دو رقم با گذشت زمان کاهش یافت به گونه‌ای که مقدار این دو صفت در رقم تجن کمتر از مرودشت بود. در همین راستا، با گذشت زمان و در تمام زمان‌های تخمیر، مقدار انرژی لازم برای کشش، مقاومت به کشش، قابلیت کشش‌پذیری و عدد نسبت در هر دو رقم افزایش یافت. اما غیر از قابلیت کشش‌پذیری خمیر، مقدار بقیه صفات در رقم تجن بیشتر از رقم مرودشت اندازه‌گیری شد. طبق پژوهش انجام شده، تاثیر انبارمانی در بهبود ویژگی‌های فیزیکو شیمیایی آرد و رئولوژیکی خمیر حاصل از رقم تجن بیشتر و معنی‌دارتر از رقم مرودشت بود.
کلیدواژه‌ها
گندم
زمان نگهداری
گلوتن مرطوب
خواص رئولوژیکی
ثابت دی‌الکتریک

موضوعات

عنوان مقاله English

The effect of storage time on dielectric constant of kernels, qualitative properties of flour and rheological characterization of two wheat cultivars (Tajan and Marvdasht)

نویسنده English

Hossein Ahmadi Chenarbon
Assistant Professor, Department of Agronomy, College of Agriculture, Varamin - Pishva Branch, Islamic Azad University, Varamin, Iran.
چکیده English

One of the most important factors contributing to bread waste in production and consumption is the use of newly-harvested wheat in some seasons. However, the occurrence of natural oxidation and formation of intermolecular bonds in the protein network improve wheat quality due to proper storage. For this purpose, this research examined the effect of storage life on the dielectric constant of wheat kernels, physiochemical properties of flour, and rheological properties of the dough from two cultivars, namely Tajan and Marvdasht, in three durations (0, 30, and 60 days). Results suggested that, with the passage of time, pH decreased in cultivars, but the protein level, wet gluten, Zeleny sedimentation, dielectric constant, and moisture increased, while the ash in both cultivars did not change significantly. Meanwhile, all measured properties, excluding pH and protein, improved more significantly in the Tajan Cultivars than in Marvdasht. Additionally, as time passed, water absorption, dough development time, and dough stability time increased in both cultivars, but the value of these indexes and the level of changes were higher in Tajan than in Marvdasht. At the same time, dough softening degrees decreased in both cultivars through time after 10 and 12 minutes with Tajan having a lower degree than Marvdasht. With the passage of time, in all durations of fermentation, the required energy for dough extension, resistance to extension, extensibility, and the ratio number Increased in both cultivars. Except for the dough extensibility, the changes in other properties in the Tajan Cultivar were higher than those of the Marvdasht Cultivar. The research concluded that the effect of storage life on physicochemical and rheological properties of the dough from Tajan was higher and more significant than those of Marvdasht.

کلیدواژه‌ها English

Wheat
storage time
wet gluten
Rheological properties
Dielectric constant
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